We present simulations of the scatter pattern of a 1D rough surface using a novel source with which both the coherence and polarization of the incident light can be controlled. This recently developed variable coherence polarimetry source allows the recovery of useful information of the rough surfaces, without having to scan over incidence or scatter angles. The source uses a liquid-crystal phase modulator to control the polarization as well as the coherence of the beam illuminating the rough surface. In our case we scanned two source spots over the rough surface by changing the phase distribution on the spatial light modulator. Changing the polarization state distribution at the source plane gives control of the polarization, or Stokes vector, of the light in these two spots, as well as a central static spot. The scattered beam is analyzed with a Stokes polarimeter. To simulate the experimental results, the Kirchhoff approximation is used to calculate the scattered Stokes vector using the experimental incident Stokes vector and intensity distribution as a source. It is shown that the material of the rough surface can be obtained from the measured scattered light, as well as an estimation of the average surface slope.
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