Presentation + Paper
16 March 2023 Multiscale and multipurpose phantoms for 2D/3D quantitative phase imaging
M. Ziemczonok, M. Kujawińska
Author Affiliations +
Proceedings Volume 12389, Quantitative Phase Imaging IX; 1238908 (2023) https://doi.org/10.1117/12.2649720
Event: SPIE BiOS, 2023, San Francisco, California, United States
Abstract
Metrology is a key aspect of any measurement technique since the information about the error is the enabling factor for their utility and developments. Quantitative phase imaging (QPI) benefit from metrology in particular, as new approaches to system design, data processing and relevant feature extraction methods require constant validation and improvements. QPI in biomedical applications span a wide range of measurement challenges ranging from sub-µm features in monolayer of cells to cm2 cell cultures, free-floating and three-dimensional cell clusters or even whole organisms. In this work we show how to create phantoms that strive to mimic all kinds of said specimens and their interaction with light, ultimately providing tool for validation and benchmarking a variety of QPI systems. We exploit many degrees of freedom provided by the two-photon polymerization technique–most notably three-dimensional shape and size, refractive index modulation and adjustable scattering properties–in order to design and fabricate various phantoms that resemble real biological microobjects, recreate the challenges of the particular measurement scenario and finally provide invaluable data for metrological analysis.
Conference Presentation
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Ziemczonok and M. Kujawińska "Multiscale and multipurpose phantoms for 2D/3D quantitative phase imaging", Proc. SPIE 12389, Quantitative Phase Imaging IX, 1238908 (16 March 2023); https://doi.org/10.1117/12.2649720
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KEYWORDS
Design and modelling

Fabrication

Refractive index

Polymers

Printing

Scanning electron microscopy

Metrology

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