Study of non-contact temperature measurement technology based on phosphorescent composite film in high temperature environment

Yi Xu; Qinnan Chen; Panhua Xu; Hongcheng Wei; Zhenyin Hai; Daoheng Sun; Hongwei Ma

doi:10.1117/12.2652101

20 January 2023 Study of non-contact temperature measurement technology based on phosphorescent composite film in high temperature environment

Yi Xu, Qinnan Chen, Panhua Xu, Hongcheng Wei, Zhenyin Hai, Daoheng Sun, Hongwei Ma

Author Affiliations +

Proceedings Volume 12558, AOPC 2022: Optical Spectroscopy and Imaging; 125580N (2023) https://doi.org/10.1117/12.2652101
Event: Applied Optics and Photonics China 2022 (AOPC2022), 2022, Beijing, China

Abstract

A composite phosphorescent temperature measurement film based on rare earth phosphorescent powder and polymer derived ceramics (PDC) was proposed in this letter. The film was made on nickel-based alloy substrate with yttrium oxide doped europium (Y2O3:Eu3+) and polysilazane (PSN2) precursor ceramic as temperature sensing substances and high-temperature bonding layer respectively. We tested the thermal properties of the film, and built a high-temperature test system based on a calibration furnace. The phosphorescence emission spectrum and 611nm/587nm phosphor intensity ratio were measured with the 407nm excitation laser. The results showed that the film can survive for more than 3 hours at 1000℃, and the adhesion strength could reach up to 30 MPa. In the temperature range of 300~947°C, there is a linear relationship between temperature and phosphorescence intensity ratio. The temperature coefficient of phosphorescence intensity ratio is 0.0149/°C, and the temperature measurement error is less than 2.3%. The influence of high temperature thermal radiation on phosphorescence temperature measurement was studied, and the calibration curve of the sensor was corrected using the thermal radiation correction method based on the theory of incoherent light. The results show that the phosphorescence intensity changes from exponential function to linear relationship with temperature, and the upper limit of temperature measurement of the sensor increases from 947℃ to 1000℃.

Citation Download Citation

Yi Xu, Qinnan Chen, Panhua Xu, Hongcheng Wei, Zhenyin Hai, Daoheng Sun, and Hongwei Ma "Study of non-contact temperature measurement technology based on phosphorescent composite film in high temperature environment", Proc. SPIE 12558, AOPC 2022: Optical Spectroscopy and Imaging, 125580N (20 January 2023); https://doi.org/10.1117/12.2652101

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KEYWORDS

Temperature metrology

Phosphorescence

Luminescence

Calibration

Sensors

Thin films

Resistance

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