Paper
18 July 2023 Numerical simulation of optimizing plating uniformity of gold plating
Jing Xiang, Hongzhi Zhang, Yongqiang Su, Zeng Chong, Chong Wang, Yaning Lin, Liangliang Tian, Guohui Hu
Author Affiliations +
Proceedings Volume 12722, Third International Conference on Mechanical, Electronics, and Electrical and Automation Control (METMS 2023); 127220Q (2023) https://doi.org/10.1117/12.2679534
Event: International Conference on Mechanical, Electronics, and Electrical and Automation Control (METMS 2023), 2023, Hangzhou, China
Abstract
The uniformity of gold plating of 6-inch wafers in conventional sulfate plating solution was studied by numerical simulation technology. The effects of current density, cathode and anode distance and baffle distance on plating uniformity were studied to obtain the gold plating layer with the uniformity of less than 5%. The results show that when the distance between the cathode and the anode is set to be 15.5 cm, and the distance between the baffle and the cathode is 4.5 cm, when the current density is 5-15A/m2, the uniformity of electroplating gold is less than 5%, which meets the production requirements.
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jing Xiang, Hongzhi Zhang, Yongqiang Su, Zeng Chong, Chong Wang, Yaning Lin, Liangliang Tian, and Guohui Hu "Numerical simulation of optimizing plating uniformity of gold plating", Proc. SPIE 12722, Third International Conference on Mechanical, Electronics, and Electrical and Automation Control (METMS 2023), 127220Q (18 July 2023); https://doi.org/10.1117/12.2679534
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KEYWORDS
Gold

Plating

Semiconducting wafers

Baffles

Electroplating

Numerical simulations

Anodes

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