Non-contact detection of toxic and hazardous chemical contaminants by short-wave infrared imaging spectroscopy

Yanrong Li; Shuai Wang; Chunchao Yu; Zhixiong Yang; Zhenggang Lei

doi:10.1117/12.3007836

18 December 2023 Non-contact detection of toxic and hazardous chemical contaminants by short-wave infrared imaging spectroscopy

Yanrong Li, Shuai Wang, Chunchao Yu, Zhixiong Yang, Zhenggang Lei

Author Affiliations +

Proceedings Volume 12960, AOPC 2023: Infrared Devices and Infrared Technology; and Terahertz Technology and Applications; 129600L (2023) https://doi.org/10.1117/12.3007836
Event: Applied Optics and Photonics China 2023 (AOPC2023), 2023, Beijing, China

Abstract

In modern warfare, environmental monitoring, national defense and social security monitoring, it is important to detect toxic and hazardous chemical contaminants on the surface of materials in target areas. Finding a rapid and non-contact technique for detecting these contaminants is urgently needed. To meet these application requirements, this article proposes a short-wave infrared (SWIR) spectral imaging detection technique based on a liquid crystal tunable filter(LCTF), and an imaging spectrometer was developed. Toxic and hazardous chemical contaminants can be accurately identified by the spectrometer, and their spatial distribution information can be intuitively displayed in images. This article analyzed various toxic and hazardous chemical liquids under different conditions, such as DMMP and dichloromethane. The results show that these chemical contaminants have obvious absorption characteristic spectrum within the spectral range of 0.95μm-1.70μm. The identified analysis results and their spatial distribution information were obtained by analyzing their characteristic spectrum. Since this detection technique does not rely on the morphological features of the target, and can achieve non-contact, long-distance detection, making it a potential and effective technique for detecting and monitoring toxic and hazardous chemical contaminants.

(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Yanrong Li, Shuai Wang, Chunchao Yu, Zhixiong Yang, and Zhenggang Lei "Non-contact detection of toxic and hazardous chemical contaminants by short-wave infrared imaging spectroscopy", Proc. SPIE 12960, AOPC 2023: Infrared Devices and Infrared Technology; and Terahertz Technology and Applications, 129600L (18 December 2023); https://doi.org/10.1117/12.3007836

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KEYWORDS

Contamination

Target detection

Short wave infrared radiation

Imaging spectroscopy

Spectroscopy

Chemical analysis

Spectroscopes

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