Single- and multiple-beam nonlinear absorption and refraction measurements in semiconductors

Arthur L. Smirl; Thomas F. Boggess; Jimmy Dubard; A. G. Cui

doi:10.1117/12.21675

1 October 1990 Single- and multiple-beam nonlinear absorption and refraction measurements in semiconductors

Arthur L. Smirl, Thomas F. Boggess, Jimmy Dubard, A. G. Cui

Proceedings Volume 1307, Electro-Optical Materials for Switches, Coatings, Sensor Optics, and Detectors; (1990) https://doi.org/10.1117/12.21675
Event: 1990 Technical Symposium on Optics, Electro-Optics, and Sensors, 1990, Orlando, FL, United States

Abstract

We describe picosecond single- and multiple-beam measurements of the nonlinear absorption and refraction in a variety of semiconductors. Single-beam and pump-probe transmission measurements are used to isolate instantaneous nonlinearities from cumulative processes. These techniques, together with a simple rate equation model, have allowed us to extract information regarding mid-gap levels and to measure both the two-photon absorption coefficients and the free carrier absorption cross sections in these samples. Our model, together with Z-scan and beam deflection measurements of the nonlinear refraction, has provided the change in index due to each photogenerated electron-hole pair.

Citation Download Citation

Arthur L. Smirl, Thomas F. Boggess, Jimmy Dubard, and A. G. Cui "Single- and multiple-beam nonlinear absorption and refraction measurements in semiconductors", Proc. SPIE 1307, Electro-Optical Materials for Switches, Coatings, Sensor Optics, and Detectors, (1 October 1990); https://doi.org/10.1117/12.21675

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