Paper
28 February 2024 A defect detection device for OLED panels
Jinlong Li, Xixin Cao, Ping Tao, Wei Li
Author Affiliations +
Proceedings Volume 13071, International Conference on Mechatronic Engineering and Artificial Intelligence (MEAI 2023); 1307107 (2024) https://doi.org/10.1117/12.3025490
Event: International Conference on Mechatronic Engineering and Artificial Intelligence (MEAI 2023), 2023, Shenyang, China
Abstract
In the production process of OLED, the test equipment of each process section is an important guarantee to improve the output. In this paper, a defect detection device for OLED panel is developed, including an electrical control unit, an image acquisition mechanism, a light source assembly and an industrial computer. Output the detection results by analyzing and processing the acquired images. The system has good real-time performance, high efficiency and strong detection ability in industrial field application. It solves the technical problems such as long detection time, low efficiency and strong subjectivity in manual detection of OLED panel defects.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Jinlong Li, Xixin Cao, Ping Tao, and Wei Li "A defect detection device for OLED panels", Proc. SPIE 13071, International Conference on Mechatronic Engineering and Artificial Intelligence (MEAI 2023), 1307107 (28 February 2024); https://doi.org/10.1117/12.3025490
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KEYWORDS
Organic light emitting diodes

Cameras

Image fusion

Defect detection

Image acquisition

Light sources

Control systems

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