Near-infrared Raman spectroscopy: potentialities of conventional scanning machines

Jacques Barbillat; A. Chapput

doi:10.1117/12.23096

1 November 1990 Near-infrared Raman spectroscopy: potentialities of conventional scanning machines

Jacques Barbillat, A. Chapput

Proceedings Volume 1341, Infrared Technology XVI; (1990) https://doi.org/10.1117/12.23096
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

We discuss the relative advantages of FT spectrometers over scanning instruments in the case of Raman spectroscopy in the near infrared. We also describe a conventional Raman laser installation especially designed for the near IR and we present some results obtained on fluorescent samples.

Citation Download Citation

Jacques Barbillat and A. Chapput "Near-infrared Raman spectroscopy: potentialities of conventional scanning machines", Proc. SPIE 1341, Infrared Technology XVI, (1 November 1990); https://doi.org/10.1117/12.23096

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