Paper
1 July 1992 Apparatus for radiation effects testing on thin film interference filters at cryogenic temperatures
Donald L. Stierwalt, Russel E. Clement
Author Affiliations +
Abstract
For many years personnel of NRaD, formerly NOSC, have been characterizing infrared focal plane filters and components at cryogenic temperatures. We have recently begun investigating the effects of ionizing radiation on these item
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Donald L. Stierwalt and Russel E. Clement "Apparatus for radiation effects testing on thin film interference filters at cryogenic temperatures", Proc. SPIE 1686, Test and Evaluation of IR Detectors and Arrays II, (1 July 1992); https://doi.org/10.1117/12.60525
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KEYWORDS
Radiation effects

Transmittance

Cryogenics

Interference filters

Optical filters

Thin films

Zinc

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