Paper
23 November 1992 Neutron microfocusing by double reflection on curved perfect crystals
Alexander Mihai Popovici, William B. Yelon
Author Affiliations +
Abstract
The imaging of large area neutron sources into millimeter-size spots by focusing with two curved perfect crystals is examined. In the parallel (+,-) setting large demagnifications can be achieved only with crystals in strongly asymmetric reflection. The most promising configurations appear to be those with crystals in antiparallel (+,+) setting. The beam intensities for the parallel and antiparallel settings of bent crystals are comparable, the reflection efficiency being enhanced by the reflectivity curve broadening. The instrument Q-resolution can be kept reasonably good in a limited range by phase space focusing. Results of neutron optics computations are presented for a diffractometer for stress scanning measurements and for a small-angle scattering instrument with long neutron paths.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexander Mihai Popovici and William B. Yelon "Neutron microfocusing by double reflection on curved perfect crystals", Proc. SPIE 1738, Neutron Optical Devices and Applications, (23 November 1992); https://doi.org/10.1117/12.130652
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Cited by 1 scholarly publication.
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KEYWORDS
Crystals

Monochromators

Diffraction

Laser crystals

Reflectivity

Silicon

Scattering

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