Laser-diode fizeau interference microscopy with a phase-shifting technique: error analysis

Yukihiro Ishii

doi:10.1117/12.2308710

23 July 1993 Laser-diode fizeau interference microscopy with a phase-shifting technique: error analysis

Yukihiro Ishii

Proceedings Volume 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology; 198383 (1993) https://doi.org/10.1117/12.2308710
Event: 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1993, Budapest, Hungary

Abstract

A laser-diode (LD) heterodyne interferometer with a BaTiO3 self-pumped phase-conjugate (PC) mirror in place of the usual mirrors is presented. The phase is shifted to produce a spatially uniform phase change uncancelled by a phase conjugator be- tween the two beams of an interferometer. The dc-light built-up PC reflectivity of -60 % is obtained for an incident angle of 14Ã‚Â° to the crystal. The heterodyne beat signal associated with varying the pump-beams frequency of LD is measured up to -1 kHz. Experimental results of phase measurement with a four-stepping method are shown.

Citation Download Citation

Yukihiro Ishii "Laser-diode fizeau interference microscopy with a phase-shifting technique: error analysis", Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 198383 (23 July 1993); https://doi.org/10.1117/12.2308710

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