Paper
27 May 1996 Laser damage processes in cleaved and polished CaF2 at 248 nm
Michael Reichling, S. Gogoll, E. Stenzel, H. Johansen, M. Huisinga, Eckart Matthias
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Abstract
Single-shot irradiation of single crystal CaF2 with 248 nm/14 ns laser light results in various degrees of degradation and damage depending on the applied laser fluence. Phenomena range from subtle, non-topographic surface modification only detectable by secondary electrons of scanning electron microscopy (SE-SEM) over cracking along crystallographic directions to the ablation of crystalline material. Significant differences are found for cleaved and polished surfaces. Findings from SEM investigations, in-situ photoacoustic mirage measurements and visual inspection of irradiated samples from a comprehensive picture of the stages of laser-induced damage.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael Reichling, S. Gogoll, E. Stenzel, H. Johansen, M. Huisinga, and Eckart Matthias "Laser damage processes in cleaved and polished CaF2 at 248 nm", Proc. SPIE 2714, 27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995, (27 May 1996); https://doi.org/10.1117/12.240356
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Cited by 7 scholarly publications.
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KEYWORDS
Polishing

Surface finishing

Crystals

Scanning electron microscopy

Laser crystals

Absorption

Laser ablation

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