Paper
11 March 1996 Effect of electric arc plasma jet treatment on porous silicon properties
V. I. Beclemishev, V. M. Maslovsky, Alexander I. Belogorokhov, G. Y. Pavlov, V. A. Karavanskii, Nikolay N. Melnik, T. N. Zavaritskaja
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Proceedings Volume 2777, ALT'95 International Symposium on Advanced Materials for Optics and Optoelectronics; (1996) https://doi.org/10.1117/12.232224
Event: ALT '95 International Conference: Advanced Materials for Optics and Optoelectronics, 1995, Prague, Czech Republic
Abstract
The effect of arc plasma jet treatment (APJT) on the porous silicon (PS) structure, surface, and photoluminescence (PL) has been studied. The investigation of PS FTIR absorption spectra indicate that the Ar/air APJT induces the decreasing of the concentration of Si-Hn, C-Hn, (n equals 1, 2, 3) bonds and corresponding increasing of Si-Ox bonds more than an order of magnitude. This transformation of surface conditions resulted in not enough large decreasing (about 2 - 3 times maximum) of the PL intensity with red shifting of the peak from 665 nm to 700 nm. These results suggest that the change of PL occurs as a result of APJT induced replacement of the Si-Hn bonds with Si-Ox bonds. We have analyzed the effect of plasma conditions on the PL characteristics. The luminescence mechanism is also discussed.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
V. I. Beclemishev, V. M. Maslovsky, Alexander I. Belogorokhov, G. Y. Pavlov, V. A. Karavanskii, Nikolay N. Melnik, and T. N. Zavaritskaja "Effect of electric arc plasma jet treatment on porous silicon properties", Proc. SPIE 2777, ALT'95 International Symposium on Advanced Materials for Optics and Optoelectronics, (11 March 1996); https://doi.org/10.1117/12.232224
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KEYWORDS
Picosecond phenomena

Silicon

Plasma

Absorption

Luminescence

Plasma treatment

Atmospheric plasma

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