Tunneling microscopic study of submicroscopic defects on the surfaces of loaded metals

Victor I. Vettegren; Sohibnasar Sh. Rakhimov; Vladimir N. Svetlov

doi:10.1117/12.299600

1 January 1998 Tunneling microscopic study of submicroscopic defects on the surfaces of loaded metals

Victor I. Vettegren, Sohibnasar Sh. Rakhimov, Vladimir N. Svetlov

Proceedings Volume 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering; (1998) https://doi.org/10.1117/12.299600
Event: International Workshop on New Approaches to High Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, 1997, St. Petersburg, Russian Federation

Abstract

Load-induced submicroscopic defects of the surfaces metals were studied with a scanning tunnelling microscope. The methodological aspects of microscopy investigation of loaded metal samples in air and nitrogen were examined in detail. Defects shaped like in a print of a triangular prism are observed to form on the surface of polished and annealed samples of Cu, Au, Mo and Pd. Original defects were 5, 15, 22 and 18 nm deep on surfaces of Pd, Cu, Au and Mo and 50 - 100 nm wide and long. The vertex angles of prism were approximately equals 70⁰ in Pd, Au and Cu surfaces and approximately equals 50⁰ or approximately equals 90⁰ on Mo surfaces. Concentrations of the defects grows, reaches a maximum value and decreases. Then there are emerged new defects which depth is 2 - 3 times more than the original one. Their concentration grows, reaches a maximum value and decreases. The following type of defects of larger sizes create on the surface, their concentration grows, reaches a new maximum value and decreases, and so on. All defects have the form much like the original defects and their deep is a multiple the original defect deep.

Citation Download Citation

Victor I. Vettegren, Sohibnasar Sh. Rakhimov, and Vladimir N. Svetlov "Tunneling microscopic study of submicroscopic defects on the surfaces of loaded metals", Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, (1 January 1998); https://doi.org/10.1117/12.299600

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