Digital speckle techniques applied to industrial precision measurements

Roberto Daniel Torroba

doi:10.1117/12.358364

6 July 1999 Digital speckle techniques applied to industrial precision measurements

Roberto Daniel Torroba

Proceedings Volume 3572, 3rd Iberoamerican Optics Meeting and 6th Latin American Meeting on Optics, Lasers, and Their Applications; (1999) https://doi.org/10.1117/12.358364
Event: 3rd Iberoamerican Optics Meeting and 6th Latin American Meeting on Optics, Lasers, and Their Applications, 1998, Cartagena de Indias, Colombia

Abstract

Digital speckle pattern interferometry (DSPI) is used to produce a fringe pattern representing speckle correlation changes. This fringe pattern has the same interpretation as that obtained with holographic interferometry. Remarkable features of this technique are the possibilities of real- time processing and software treatment. Due to these characteristics, DSPI becomes an attractive option to the non-destructive testing an evaluation. Through different analysis of the fringes, it is possible to get quantitative information about the correlation changes that gave rise to the pattern. We are going to introduce three alternatives of digital speckle to precision measurements: focal length (fringe positional changes), angle measurements (fringe visibility changes), and topography (digital fringe generation by moire). Theoretical demonstrations will be outlined and experimental results will be presented.

Citation Download Citation

Roberto Daniel Torroba "Digital speckle techniques applied to industrial precision measurements", Proc. SPIE 3572, 3rd Iberoamerican Optics Meeting and 6th Latin American Meeting on Optics, Lasers, and Their Applications, (6 July 1999); https://doi.org/10.1117/12.358364

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
9 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Fringe analysis

Visibility

Speckle

Moire patterns

Speckle pattern

CCD cameras

Image processing

Show All Keywords

Keywords/Phrases

Search In:

Publication Years