Paper
19 October 1999 High-flux x-ray response of composite mercuric iodide detectors
Michael M. Schieber, Asaf Zuck, Leonid Melekhov, Rubil Shatunovsky, Haim Hermon, Renato A. D. Turchetta
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Abstract
A theological model is presented which analyses the sensitivity of composite detectors to a flux of x-rays emerging form a radiological x-ray generator. The model describes the many factor which influenced the x-ray response, for the case where the detector is composed of several layers of crystallites separated by a polymeric glue as is the case of composite HgI2 detectors fabricated by the screen print method. The model also describes the variation of the sensitivity with grain size and dielectric constant, taking into account the dielectric constant of the binder showing also the experimental result. Finally, the experimental result of the sensitivity vs. the voltage is shown for single crystal and composite HgI2 detectors and these results are compared with polycrystalline PbI2 and a-Se, which are the main material candidates for medical digital radiology.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael M. Schieber, Asaf Zuck, Leonid Melekhov, Rubil Shatunovsky, Haim Hermon, and Renato A. D. Turchetta "High-flux x-ray response of composite mercuric iodide detectors", Proc. SPIE 3768, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics, (19 October 1999); https://doi.org/10.1117/12.366594
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Cited by 32 scholarly publications and 1 patent.
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KEYWORDS
Sensors

Crystals

Composites

Semiconductors

X-rays

Dielectrics

X-ray detectors

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