Analysis Of Laser Desorption By Secondary Ion Mass Spectrometry

Alan R. Burns

doi:10.1117/12.934770

7 November 1983 Analysis Of Laser Desorption By Secondary Ion Mass Spectrometry

Alan R. Burns

Proceedings Volume 0380, Los Alamos Conf on Optics '83; (1983) https://doi.org/10.1117/12.934770
Event: Los Alamos Conference on Optics, 1983, New Mexico, United States

Abstract

For the first time, laser-induced thermal desorption is examined with secondary ion mass spectrometry (SIMS). The desorption of small molecules on a polycrystalline tungsten surface by high-intensity (up to 176 MW/cm²), 1064-nm pulses of 8-10 nsec duration is analyzed by monitoring relative changes in the SIMS intensities. Despite the very high surface temperatures (3000 K) obtained by the absorption of intense laser radiation, the observed changes are much smaller than predicted by the equilibrium model of thermal desorption.

Citation Download Citation

Alan R. Burns "Analysis Of Laser Desorption By Secondary Ion Mass Spectrometry", Proc. SPIE 0380, Los Alamos Conf on Optics '83, (7 November 1983); https://doi.org/10.1117/12.934770

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