Paper
29 December 1999 Waveguiding in anisotropic planar structures
Ondrej Barta, Frantisek Stanek, Tomas Kreml, Jaromir Pistora
Author Affiliations +
Proceedings Volume 4016, Photonics, Devices, and Systems; (1999) https://doi.org/10.1117/12.373602
Event: Photonics Prague '99, 1999, Prague, Czech Republic
Abstract
The study of guided modes in planar thin film structures allows a precise characterization of the refractive index, the thickness, and the optical anisotropy. On the base of the matrix elements, the conditions for waveguiding in magneto-optical thin films at transversal geometry have been specified. In this case there are two independent dispersion relations for TE and TM guided modes. Usually we assume that the relative permeability is equal to 1 in the frame of optical frequencies. This approximation is problematic in far IR region and for ultrathin films in the optical one. For this reason the formulae of dispersion relations for guided modes in a monolayer system with both permittivity and permeability tensors have been derived. Various planar configurations are simulated. The permeability tensor effect at transversal magnetization in waveguiding structure is analyzed in detail. The experimental possibilities of the dark mode spectroscopy for permeability tensor study in mentioned structures are briefly discussed.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ondrej Barta, Frantisek Stanek, Tomas Kreml, and Jaromir Pistora "Waveguiding in anisotropic planar structures", Proc. SPIE 4016, Photonics, Devices, and Systems, (29 December 1999); https://doi.org/10.1117/12.373602
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Cited by 2 scholarly publications.
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KEYWORDS
Thin films

Polarization

Magnetism

Dispersion

Waveguides

Refractive index

Prisms

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