Paper
2 September 2003 Distributed control and measurement system (DCS) preferable to design-for-testability (DfT) for analog ICs
Guonan Zhao, Jianping Hu, Fuhong Zhang, Linbin Cheng
Author Affiliations +
Proceedings Volume 5253, Fifth International Symposium on Instrumentation and Control Technology; (2003) https://doi.org/10.1117/12.521989
Event: Fifth International Symposium on Instrumentation and Control Technology, 2003, Beijing, China
Abstract
A fast and efficient method for element-identification and Analog-DfT with the aid of ac Josephson voltages has been found from several papers listed in our references where specified terms Novel-Optimum-Identification (NOI) and Fast-Convergence-Identification (FCI) have been emphasized. Not only those issues in our DCS, the Controllability and Observability, but also the hazard-proof abilities vs the parasitic stray capacitive coupling anywhere especially inside each device in analog interface circuits have to be taken into consideration for our analog-DfT requirement. A computer program based on the method has been made and tested for its efficiency and capability.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Guonan Zhao, Jianping Hu, Fuhong Zhang, and Linbin Cheng "Distributed control and measurement system (DCS) preferable to design-for-testability (DfT) for analog ICs", Proc. SPIE 5253, Fifth International Symposium on Instrumentation and Control Technology, (2 September 2003); https://doi.org/10.1117/12.521989
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KEYWORDS
Analog electronics

Control systems

Information technology

Capacitive coupling

Cesium

Rubidium

Control systems design

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