Two-color HgCdTe focal plane detector simulation

Thomas J. Sanders; Glenn T. Hess; Scott Eisert

doi:10.1117/12.542342

5 August 2004 Two-color HgCdTe focal plane detector simulation

Thomas J. Sanders, Glenn T. Hess, Scott Eisert

Proceedings Volume 5407, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XV; (2004) https://doi.org/10.1117/12.542342
Event: Defense and Security, 2004, Orlando, Florida, United States

Abstract

This paper describes a simulation technology for HgCdTe infrared detectors used in advanced IR focal plane array architectures. This model addresses the material processes needed for fabrication and the electrical characteristics of multi-layer structures covering a wide range of wavelengths from middle wavelength to very long wavelength.

Citation Download Citation

Thomas J. Sanders, Glenn T. Hess, and Scott Eisert "Two-color HgCdTe focal plane detector simulation", Proc. SPIE 5407, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XV, (5 August 2004); https://doi.org/10.1117/12.542342

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