Optical-electronic technologies in materials analysis

Veacheslav L. Perju; David P. Casasent; Valeriy S. Feshchenko; Lubov V. Feshchenko

doi:10.1117/12.604321

28 March 2005 Optical-electronic technologies in materials analysis

Veacheslav L. Perju, David P. Casasent, Valeriy S. Feshchenko, Lubov V. Feshchenko

Proceedings Volume 5816, Optical Pattern Recognition XVI; (2005) https://doi.org/10.1117/12.604321
Event: Defense and Security, 2005, Orlando, Florida, United States

Abstract

It is proposed a new optical electronic approach for effective, simple and non expensive testing of the materials. An optical correlator is used for high speed features extraction, which characterize the distribution of the informational important elements in the crystallographic image. The digital “portrait” of the analyzed material is constructed which is compared with the set of the standard “portraits” on the base of which the level of the quality of the material is determined. The method permits to automate the process of the crystallographic images analyses and to increase the reliability of the results.

Citation Download Citation

Veacheslav L. Perju, David P. Casasent, Valeriy S. Feshchenko, and Lubov V. Feshchenko "Optical-electronic technologies in materials analysis", Proc. SPIE 5816, Optical Pattern Recognition XVI, (28 March 2005); https://doi.org/10.1117/12.604321

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