Paper
19 May 2006 Digitalization measurement of structure parameters of optic low-pass filter
Yunchuan Li, Bin Lin, Zhuangfei Wu, Liewei Zhu, Xiangqun Cao
Author Affiliations +
Abstract
A digitalization measurement method of structure parameters of optical low-pass filter (OLPF) is presented in this paper. OLPF which comprises two or three crystal plates is adopted in front of the CCD to reduce aliasing in a digitized image. Transiting a triple plate OLPF, an object of the point-source light can separate into eight points which are imaged in CMOS array. The distance of point to point provides us with the information of thickness of each crystal plate. The accuracy of measurement is better than 0.15μm.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yunchuan Li, Bin Lin, Zhuangfei Wu, Liewei Zhu, and Xiangqun Cao "Digitalization measurement of structure parameters of optic low-pass filter", Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61501G (19 May 2006); https://doi.org/10.1117/12.676417
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Crystals

Linear filtering

Digital filtering

Nonlinear crystals

Digital image processing

Image sensors

Optical sensors

RELATED CONTENT


Back to Top