Triangulation With Expanded Range Of Depth

G Hausler; M Maul

doi:10.1117/12.938261

17 November 1986 Triangulation With Expanded Range Of Depth

G Hausler, M Maul

Proceedings Volume 0654, Automatic Optical Inspection; (1986) https://doi.org/10.1117/12.938261
Event: 1986 International Symposium/Innsbruck, 1986, Innsbruck, Austria

Abstract

We present a scanning triangulation system for large objects with high lateral and longitudinal resolution. The system is based on axicons in the illumination device and on the use of the Scheimpflug-condition in the observation path. We describe a scanning-by-deflection geometry that minimizes the number of necessary detector pixels.

Citation Download Citation

G Hausler and M Maul "Triangulation With Expanded Range Of Depth", Proc. SPIE 0654, Automatic Optical Inspection, (17 November 1986); https://doi.org/10.1117/12.938261

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