Paper
22 November 1986 Experimental Evidence And Characterization Of Resonant Impurity Levels By Magneto-Transport Experiments Under Hydrostatic Pressure In HgCdTe.
J L Robert, A Raymond, C Bousquet, L Ghenim
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Proceedings Volume 0659, Materials Technologies for Infrared Detectors; (1986) https://doi.org/10.1117/12.938541
Event: 1986 International Symposium/Innsbruck, 1986, Innsbruck, Austria
Abstract
The aim of this paper is to demonstrate that transport experiments under high magnetic fields and under hydrostatic pressure are a very convenient tool to characterize impurity levels in II-VI compounds. The method has been used in the cases of bulk . semiconductors and of implanted thin films. The existence of resonant impurity states has been clearly pointed out. In the particular case of boron implanted thin films the experiments demonstrate clearly the existence of a resonant level induced by implantation and located approximately at 150 meV above the conduction band minimum.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J L Robert, A Raymond, C Bousquet, and L Ghenim "Experimental Evidence And Characterization Of Resonant Impurity Levels By Magneto-Transport Experiments Under Hydrostatic Pressure In HgCdTe.", Proc. SPIE 0659, Materials Technologies for Infrared Detectors, (22 November 1986); https://doi.org/10.1117/12.938541
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KEYWORDS
Magnetism

Semiconductors

Electrons

Cadmium

Magnetic semiconductors

Boron

Infrared detectors

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