Stationary and non-stationary noise in superconducting quantum devices

I. Martin; L. Bulaevskii; A. Shnirman; Y. M. Galperin

doi:10.1117/12.725639

8 June 2007 Stationary and non-stationary noise in superconducting quantum devices

I. Martin, L. Bulaevskii, A. Shnirman, Y. M. Galperin

Proceedings Volume 6600, Noise and Fluctuations in Circuits, Devices, and Materials; 660005 (2007) https://doi.org/10.1117/12.725639
Event: SPIE Fourth International Symposium on Fluctuations and Noise, 2007, Florence, Italy

Abstract

We consider two representative problems that deal with the fluctuator-induced decoherence from two very different perspectives-microscopic and macroscopic. In the first part, we consider an individual two-level system inside a Josephson junction shunted by a resistor. If the TLS modulates the Josephson energy and/or is optically active, it can be Rabi driven by the Josephson oscillation. The Rabi oscillations, in turn, translate into oscillations of current and voltage which can be detected in noise measurements. This effect provides an option to fully characterize the TLS inside Josephson junction and to find the TLS's contribution to the decoherence when the junction is used as a qubit. In the second part, we study the contribution of an ensemble of non-stationary glassy charge fluctuators on qubit decoherence. Low-temperature dynamics of insulating glasses is dominated by a macroscopic concentration of tunneling two-level systems. Due to exponentially broad distribution of their tunneling rates and the finite experimental manipulation timescales, some of the fluctuators are temporarily stuck in high-energy non-thermal states. We find that at low enough temperatures, non-stationary contribution due to these slow non-thermal fluctuators can dominate the stationary (thermal) one, and discuss how this effect can be minimized.

Citation Download Citation

I. Martin, L. Bulaevskii, A. Shnirman, and Y. M. Galperin "Stationary and non-stationary noise in superconducting quantum devices", Proc. SPIE 6600, Noise and Fluctuations in Circuits, Devices, and Materials, 660005 (8 June 2007); https://doi.org/10.1117/12.725639

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