Damage thresholds and morphology of the front- and back-irradiated SiO<sub>2</sub> thin films containing gold nanoparticles as artificial absorbing defects

S. Papernov; A. W. Schmid; J. B. Oliver; A. L. Rigatti

doi:10.1117/12.752616

18 December 2007 Damage thresholds and morphology of the front- and back-irradiated SiO₂ thin films containing gold nanoparticles as artificial absorbing defects

S. Papernov, A. W. Schmid, J. B. Oliver, A. L. Rigatti

Author Affiliations +

Proceedings Volume 6720, Laser-Induced Damage in Optical Materials: 2007; 67200G (2007) https://doi.org/10.1117/12.752616
Event: Boulder Damage Symposium XXXIX: Annual Symposium on Optical Materials for High Power Lasers, 2007, Boulder, Colorado, United States

Abstract

Previous ultraviolet-pulsed, laser-damage studies using model thin films with gold nanoparticles as artificial absorbing defects revealed damage morphology in a form of submicrometer-scaled craters. It was also demonstrated that for defects smaller than 20 nm, crater formation is preceded by plasma-ball formation around absorbing defects. In this work an attempt is made to verify symmetry of the plasma ball by conducting film irradiation from the side of the air/film or substrate/film interfaces. In each case, crater-formation thresholds are derived and crater morphology is analyzed by means of atomic force microscopy.

Citation Download Citation

S. Papernov, A. W. Schmid, J. B. Oliver, and A. L. Rigatti "Damage thresholds and morphology of the front- and back-irradiated SiO₂ thin films containing gold nanoparticles as artificial absorbing defects", Proc. SPIE 6720, Laser-Induced Damage in Optical Materials: 2007, 67200G (18 December 2007); https://doi.org/10.1117/12.752616

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