Four-tip scanning tunneling microscope for measuring transport in nanostructures

Shuji Hasegawa; Shinya Yoshimoto; Rei Hobara

doi:10.1117/12.764823

9 January 2008 Four-tip scanning tunneling microscope for measuring transport in nanostructures

Shuji Hasegawa, Shinya Yoshimoto, Rei Hobara

Proceedings Volume 6800, Device and Process Technologies for Microelectronics, MEMS, Photonics, and Nanotechnology IV; 68000G (2008) https://doi.org/10.1117/12.764823
Event: SPIE Microelectronics, MEMS, and Nanotechnology, 2007, Canberra, ACT, Australia

Abstract

By controlling four tips independently, mechanically and electrically, in an organic manner, we can do novel measurements in nanometer scales, which are impossible by single-tip scanning tunneling microscopes (STM). The four-tip STM makes possible to measure electrical properties of nano-scale devices and materials, and also to directly image Green's function that represents propagation of electron wavefunction. We can now bring two tips as close as 20 nm to each other by using conductive carbon-nanotube tips in the four-tip STM. A new controller which drives the four tips with a single computer is another important clue for practical use of the four-tip STM.

Citation Download Citation

Shuji Hasegawa, Shinya Yoshimoto, and Rei Hobara "Four-tip scanning tunneling microscope for measuring transport in nanostructures", Proc. SPIE 6800, Device and Process Technologies for Microelectronics, MEMS, Photonics, and Nanotechnology IV, 68000G (9 January 2008); https://doi.org/10.1117/12.764823

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