Paper
30 December 2008 Comparative damage study on ytterbium-doped materials for diode-pumped high energy lasers
R. Bödefeld, J. Koerner, M. Siebold, M. Wolf, A. Herrmann, J. Hein, M. C. Kaluza
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Abstract
We report on a comparative study of the damage threshold of ytterbium-doped laser materials which are important for diode-pumped, high-energy class short pulse lasers. Both surface and bulk damage thresholds at the lasing wavelength of 1030 nm were investigated. A pulse duration of 6.4 ns was chosen which allows a scaling of the damage threshold for gain media in q-switched lasers as well as chirped-pulse amplifiers. In order to achieve comparability and repeatability of the damage measurements the surface preparation of the used samples was kept constant. Furthermore, the correlation of the bulk damage threshold and the UV absorption spectra was analyzed.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. Bödefeld, J. Koerner, M. Siebold, M. Wolf, A. Herrmann, J. Hein, and M. C. Kaluza "Comparative damage study on ytterbium-doped materials for diode-pumped high energy lasers", Proc. SPIE 7132, Laser-Induced Damage in Optical Materials: 2008, 713214 (30 December 2008); https://doi.org/10.1117/12.804431
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KEYWORDS
Absorption

Laser damage threshold

Semiconductor lasers

Crystals

Ultraviolet radiation

Atomic force microscopy

Optical amplifiers

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