High accuracy star image locating and imaging calibration for star sensor technology

Shaodi Zhang; Zhijun Zhang

doi:10.1117/12.885374

28 December 2010 High accuracy star image locating and imaging calibration for star sensor technology

Shaodi Zhang, Zhijun Zhang

Proceedings Volume 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation; 75442T (2010) https://doi.org/10.1117/12.885374
Event: Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 2010, Hangzhou, China

Abstract

Today aircraft attitude measurement technology plays an important role in an aircraft system because it can provide orientation for aircraft in action. Lately star sensor technology used in aircraft attitude measurement has become more and more popular because of its high accuracy, light weight, without attitude accumulation errors and other advantages. There are three main steps for star sensor to measure aircraft attitude, star image locating, star identification and attitude tracking. The latter two steps are based on the accuracy of star image locating. So it's critical to make efforts to advance the accuracy of star image locating. Some imaging errors, such as spherical aberration or coma aberration, also have negative effect on the accuracy of star image locating, of which the effect is necessarily reduced as well. At the beginning of this article, the structure of star sensor hardware is introduced. Secondly three methods for star image locating are described specifically, which are traditional centroid method, Gauss quadric fitting method and improved Gauss quadric fitting method. Subsequently an imaging calibration method is described for the purpose of reducing the effect of imaging errors. Finally the experiment shows that the accuracy of the star sensor is 2-arc-second.

Citation Download Citation

Shaodi Zhang and Zhijun Zhang "High accuracy star image locating and imaging calibration for star sensor technology", Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75442T (28 December 2010); https://doi.org/10.1117/12.885374

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available