Measurement of gas permeation through packaging materials of OLED by mass spectrometry

Dongliang Wang; Junjian Li; Xiaohui Wang; Jianxiang Li

doi:10.1117/12.866110

22 October 2010 Measurement of gas permeation through packaging materials of OLED by mass spectrometry

Dongliang Wang, Junjian Li, Xiaohui Wang, Jianxiang Li

Proceedings Volume 7658, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology; 76583T (2010) https://doi.org/10.1117/12.866110
Event: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2010, Dalian, China

Abstract

Mass spectrometry method was introduced to measure the gas permeability of OLED packaging materials in this paper. Mass spectrum measuring gas permeability of barrier material have the characteristics of quick measure speed, may measuring any gas permeability, and high sensitivity. The penetration rates and the permeability coefficient of water vapor, oxygen and carbon dioxide permeating the encapsulation materials of OLED such as PET plastic film, UV curable adhesive and vacuum sealing wax film have been measured by using the mass spectrometry. The results of experiments show that the permeability coefficient of water vapor through a PET plastic film is 1.8×10^-6 cm²/s, and of water vapor through UV curable adhesive is 1.2×10^-6 cm²/s at temperature of 80 °C and relative humidity of 68 %. The water permeability coefficient of vacuum sealing wax at 50 °C and 92 %RH is 1.4×10^-7 g/m²day. The water permeability of vacuum sealing wax decreases an order of magnitude than that of UV curable adhesive, So Vacuum sealing wax is suitable for the seal material in the packing of OLED than UV curable adhesive.

Citation Download Citation

Dongliang Wang, Junjian Li, Xiaohui Wang, and Jianxiang Li "Measurement of gas permeation through packaging materials of OLED by mass spectrometry", Proc. SPIE 7658, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology, 76583T (22 October 2010); https://doi.org/10.1117/12.866110

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available