Hierarchical characterization procedures for dimensional metrology

David MacKinnon; Jean-Angelo Beraldin; Luc Cournoyer; Benjamin Carrier

doi:10.1117/12.872124

27 January 2011 Hierarchical characterization procedures for dimensional metrology

David MacKinnon, Jean-Angelo Beraldin, Luc Cournoyer, Benjamin Carrier

Proceedings Volume 7864, Three-Dimensional Imaging, Interaction, and Measurement; 786402 (2011) https://doi.org/10.1117/12.872124
Event: IS&T/SPIE Electronic Imaging, 2011, San Francisco Airport, California, United States

Abstract

We present a series of dimensional metrology procedures for evaluating the geometrical performance of a 3D imaging system that have either been designed or modified from existing procedures to ensure, where possible, statistical traceability of each characteristic value from the certified reference surface to the certifying laboratory. Because there are currently no internationally-accepted standards for characterizing 3D imaging systems, these procedures have been designed to avoid using characteristic values provided by the vendors of 3D imaging systems. For this paper, we focus only on characteristics related to geometric surface properties, dividing them into surface form precision and surface fit trueness. These characteristics have been selected to be familiar to operators of 3D imaging systems that use Geometrical Dimensioning and Tolerancing (GD&T). The procedures for generating characteristic values would form the basis of either a volumetric or application-specific analysis of the characteristic profile of a 3D imaging system. We use a hierarchical approach in which each procedure builds on either certified reference values or previously-generated characteristic values. Starting from one of three classes of surface forms, we demonstrate how procedures for quantifying for flatness, roundness, angularity, diameter error, angle error, sphere-spacing error, and unidirectional and bidirectional plane-spacing error are built upon each other. We demonstrate how these procedures can be used as part of a process for characterizing the geometrical performance of a 3D imaging system.

Citation Download Citation

David MacKinnon, Jean-Angelo Beraldin, Luc Cournoyer, and Benjamin Carrier "Hierarchical characterization procedures for dimensional metrology", Proc. SPIE 7864, Three-Dimensional Imaging, Interaction, and Measurement, 786402 (27 January 2011); https://doi.org/10.1117/12.872124

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available