Temporal modulated deflectometry for painted surface inspection

Toru Kurihara; Shigeru Ando; Michihiko Yoshimura

doi:10.1117/12.2184810

22 June 2015 Temporal modulated deflectometry for painted surface inspection

Toru Kurihara, Shigeru Ando, Michihiko Yoshimura

Proceedings Volume 9525, Optical Measurement Systems for Industrial Inspection IX; 952518 (2015) https://doi.org/10.1117/12.2184810
Event: SPIE Optical Metrology, 2015, Munich, Germany

Abstract

We present a fast method for measuring a curved specular surface defect, which is the temporal modulated deflectometry. The system uses correlation image sensor, which is developed by us. The correlation image sensor(CIS) outputs temporal correlation between intensity signal and reference signal. We moves rectangular pattern to generate temporal signal. There is no need to use sinusoidal intensity pattern for phase measuring deflectometry(PMD) because CIS captures only fundamental frequency component of rectangular wave projected on the screen. Hence, the methodology we proposed has a potential for fast inspection system using only single frame.

Citation Download Citation

Toru Kurihara, Shigeru Ando, and Michihiko Yoshimura "Temporal modulated deflectometry for painted surface inspection", Proc. SPIE 9525, Optical Measurement Systems for Industrial Inspection IX, 952518 (22 June 2015); https://doi.org/10.1117/12.2184810

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