High-precision 3D metrology for stacked diffractive augmented reality waveguides

Daniel Winters; Masashi Mitsui; Masamichi Ueda; Sven Sassning; Mohit Yadav; Patrik Langehanenberg; Jan-Hinrich Eggers

doi:10.1117/12.2688509

30 November 2023 High-precision 3D metrology for stacked diffractive augmented reality waveguides

Daniel Winters, Masashi Mitsui, Masamichi Ueda, Sven Sassning, Mohit Yadav, Patrik Langehanenberg, Jan-Hinrich Eggers

Proceedings Volume PC12778, Optifab 2023; PC127780C (2023) https://doi.org/10.1117/12.2688509
Event: SPIE Optifab, 2023, Rochester, New York, United States

Abstract

Diffractive waveguides for Augmented Reality (AR) are often stacks of 2 or 3 single waveguides, with each individual waveguide designed for 1 or 2 narrow-band wavelength bands. For best image quality, the optical axes of all elements of the waveguide stack must coincide to well below 1 arcmin for all 3 RGB colors, otherwise chromatic aberration effects at edges occur, severely reducing the image quality for the user. Therefore,1) the optical axis of each waveguide in the stack must be characterized after manufacturing and compatible sets of waveguides must be matched; 2) the stacking process must not introduce tilt errors. Metrology solutions for both 1) and 2) and the effect of errors on the image quality of the finished waveguide will be presented.

Conference Presentation

Citation Download Citation

Daniel Winters, Masashi Mitsui, Masamichi Ueda, Sven Sassning, Mohit Yadav, Patrik Langehanenberg, and Jan-Hinrich Eggers "High-precision 3D metrology for stacked diffractive augmented reality waveguides", Proc. SPIE PC12778, Optifab 2023, PC127780C (30 November 2023); https://doi.org/10.1117/12.2688509

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