Exploring the impact of pressure on contact OCT imaging and epidermal thickness measurements

Zhiying Xie; Yaping Shi; Ruikang K. Wang

doi:10.1117/12.3005747

13 March 2024 Exploring the impact of pressure on contact OCT imaging and epidermal thickness measurements

Zhiying Xie, Yaping Shi, Ruikang K. Wang

Proceedings Volume PC12816, Photonics in Dermatology and Plastic Surgery 2024; PC128160J (2024) https://doi.org/10.1117/12.3005747
Event: SPIE BiOS, 2024, San Francisco, California, United States

Abstract

Accurate and repeatable epidermal thickness (ET) measurement is essential for assessing and quantifying cutaneous characteristics in dermatological disease, skin injury, and cosmetic research. Here, we investigated the integration of pressure sensors with optical coherence tomography (OCT) for improved epidermal thickness (ET) measurements. Traditional contact imaging techniques could induce variations in measurement due to inconsistent pressure. By using pressure sensors, real-time monitoring of applied pressure during OCT imaging provides stable and consistent ET mapping, improving repeatability. The result further demonstrates that increased compression forces can lead to significant deformation of the epidermis. This study demonstrates a pressure sensor integration to allow more accurate ET measurements and offers improved imaging quality, with potential applications in dermatology and cosmetics, underscoring the need for controlled pressure in contact imaging.

Conference Presentation

Citation Download Citation

Zhiying Xie, Yaping Shi, and Ruikang K. Wang "Exploring the impact of pressure on contact OCT imaging and epidermal thickness measurements", Proc. SPIE PC12816, Photonics in Dermatology and Plastic Surgery 2024, PC128160J (13 March 2024); https://doi.org/10.1117/12.3005747

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