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17 March 2014 Effect of size of aluminum/silicon dioxide/aluminum nanosandwich films on their optical properties
Yi-Jun Jen, Hung-Sheng Liao, Meng-Jie Lin
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Journal of Nanophotonics, Vol. 8, Issue 1, 083994 (March 2014). https://doi.org/10.1117/1.JNP.8.083994
Abstract
Three aluminum (Al)/silicon dioxide (SiO 2 )/aluminum (Al) nanosandwich films (SWFs) of various heights were fabricated using glancing angle deposition. An SWF comprises a 45-nm thick SiO 2 layer sandwiched between two Al nanopillars. The thicknesses of both top and bottom nanopillars were varied from 187.5 to 217.5 nm. The equivalent constitutive and related parameters of each SWF were obtained from the reflection coefficients and transmission coefficients that were measured using a walk-off interferometer. Both the equivalent permittivity and the equivalent permeability of each SWF turned out to be negative real. Exactly how the height of the Al nanopillars of the double negative SWF affects its low reflectance through destructive interference is also examined using the wave tracing method. Moreover, the localized reversed magnetic field in the SiO 2 layer of each SWF was simulated by finite-difference time-domain method to qualitatively interpret the negative real permeability.
CC BY: © The Authors. Published by SPIE under a Creative Commons Attribution 4.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.
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Yi-Jun Jen, Hung-Sheng Liao, and Meng-Jie Lin "Effect of size of aluminum/silicon dioxide/aluminum nanosandwich films on their optical properties," Journal of Nanophotonics 8(1), 083994 (17 March 2014). https://doi.org/10.1117/1.JNP.8.083994
Published: 17 March 2014
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KEYWORDS
Aluminum
Magnetism
Refractive index
Reflectivity
Optical properties
Transmittance
Destructive interference
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