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20 November 2018 Full simulation model for laser triangulation measurement in an inhomogeneous refractive index field
Rüdiger Beermann, Lorenz Quentin, Gunnar Stein, Eduard Reithmeier, Markus Kästner
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Abstract
The optical inspection of wrought hot workpieces between subsequent forming steps of a multistage process chain can yield diverse advantages. Deficient components can be detected in an early forming stage. Moreover, the eliminated cooling economizes heating energy. The present workpiece temperature can be exploited in the following chain steps. Challenges arise due to the heat input into the air surrounding the workpiece, as triangulation techniques rely on homogeneous optical conditions. The effect of an inhomogeneous refractive index field (RIF) in air on a 3-D geometry measurement by optical triangulation is modeled exemplary by a virtual measurement of a hot cylinder. To our knowledge, this is the first simulation approach that fully considers both light deflection from the illumination unit to object and from object to camera. Simulated measurement results in a homogeneous and an inhomogeneous RIF are compared. The presented approach predicts measurement deviations in inhomogeneous optical media and can help to design actuated or computer-assisted compensation routines in order to reduce deflection effects when measuring hot objects.
CC BY: © The Authors. Published by SPIE under a Creative Commons Attribution 4.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.
Rüdiger Beermann, Lorenz Quentin, Gunnar Stein, Eduard Reithmeier, and Markus Kästner "Full simulation model for laser triangulation measurement in an inhomogeneous refractive index field," Optical Engineering 57(11), 114107 (20 November 2018). https://doi.org/10.1117/1.OE.57.11.114107
Received: 18 May 2018; Accepted: 23 October 2018; Published: 20 November 2018
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CITATIONS
Cited by 14 scholarly publications.
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KEYWORDS
Cameras

Sensors

Ray tracing

Optical simulations

Content addressable memory

Refractive index

Device simulation

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