PROCEEDINGS VOLUME 0257
1980 HUNTSVILLE TECHNICAL SYMPOSIUM | 30 SEPTEMBER - 2 OCTOBER 1980
Radiation Scattering in Optical Systems
IN THIS VOLUME

0 Sessions, 28 Papers, 0 Presentations
All Papers  (28)
1980 HUNTSVILLE TECHNICAL SYMPOSIUM
30 September - 2 October 1980
Huntsville, United States
All Papers
Proc. SPIE 0257, Scattered Thoughts On Baffling Problems, 0000 (3 March 1981); doi: 10.1117/12.959596
Proc. SPIE 0257, Simplified Techniques For Estimating Out-Of-Field Radiation, 0000 (3 March 1981); doi: 10.1117/12.959597
Proc. SPIE 0257, First-Order Design Of Optical Baffles, 0000 (3 March 1981); doi: 10.1117/12.959598
Proc. SPIE 0257, General Concepts And Approach On Making Stray Light Calculations Without The Use Of Large Computers, 0000 (3 March 1981); doi: 10.1117/12.959599
Proc. SPIE 0257, Formulas For Estimating Stray-Radiation Levels In Well-Baffled Optical Systems, 0000 (3 March 1981); doi: 10.1117/12.959600
Proc. SPIE 0257, APART/PADE Version 7: A Deterministic Computer Program Used To Calculate Scattered And Diffracted Energy, 0000 (3 March 1981); doi: 10.1117/12.959601
Proc. SPIE 0257, Method For Calculating Diffraction Effects In Opto-Mechanical Systems Of Arbitrary Geometry, 0000 (3 March 1981); doi: 10.1117/12.959602
Proc. SPIE 0257, Simulation Of Stray Light In Optical Systems With The Guerap III, 0000 (3 March 1981); doi: 10.1117/12.959603
Proc. SPIE 0257, Scintillation Detector Optimization Using GUERAP-3, 0000 (3 March 1981); doi: 10.1117/12.959604
Proc. SPIE 0257, Stray Radiation Analysis Programs (GUERAP III-APART/PADE): A User's Viewpoint, 0000 (3 March 1981); doi: 10.1117/12.959605
Proc. SPIE 0257, Radiation Transfer Via Reflection From Nonimaging Specular Surfaces, 0000 (3 March 1981); doi: 10.1117/12.959606
Proc. SPIE 0257, Experimental Stray Light Measurements, 0000 (3 March 1981); doi: 10.1117/12.959607
Proc. SPIE 0257, Stray Radiation And The Infrared Astronomical Satellite (IRAS) Telescope, 0000 (3 March 1981); doi: 10.1117/12.959608
Proc. SPIE 0257, Comparison of stray light mechanisms and performance in the Infrared Astronomy Satellite (IRAS) and Shuttle Infrared Telescope Facility (SIRTF) telescopes, 0000 (3 March 1981); doi: 10.1117/12.959609
Proc. SPIE 0257, Straylight Analysis Of The German Infrared Laboratory (GIRL), 0000 (3 March 1981); doi: 10.1117/12.959610
Proc. SPIE 0257, The Theory And Measurement Of Bidirectional Reflectance Distribution Function (Brdf) And Bidirectional Transmittance Distribution Function (BTDF), 0000 (3 March 1981); doi: 10.1117/12.959611
Proc. SPIE 0257, Far-Infrared (FIR) Optical Black Bidirectional Reflectance Distribution Function (BRDF), 0000 (3 March 1981); doi: 10.1117/12.959612
Proc. SPIE 0257, Characterization Of Scattering From Diamond-Turned Surfaces, 0000 (3 March 1981); doi: 10.1117/12.959613
Proc. SPIE 0257, Microprocessor-Based Instrumentation For Bidirectional Reflectance Distribution Function (BRDF) Measurements From Visible To Far Infrared (FIR), 0000 (3 March 1981); doi: 10.1117/12.959614
Proc. SPIE 0257, Bidirectional Reflectance Distribution Function Of Gold-Plated Sandpaper, 0000 (3 March 1981); doi: 10.1117/12.959615
Proc. SPIE 0257, Absorbing Coatings For The Far Infrared, 0000 (3 March 1981); doi: 10.1117/12.959616
Proc. SPIE 0257, Panicle Contamination From Martin Optical Black, 0000 (3 March 1981); doi: 10.1117/12.959617
Proc. SPIE 0257, Scattering From Surface Roughness�Implications On X-Ray Imaging, 0000 (3 March 1981); doi: 10.1117/12.959618
Proc. SPIE 0257, Visible Light Scatter Measurements Of The Advanced X-ray Astronomical Facility (AXAF) Mirror Samples, 0000 (3 March 1981); doi: 10.1117/12.959619
Proc. SPIE 0257, Measurements Of X-Ray Scattering From Wolter Type Telescopes and Various Flat Zerodur Mirrors, 0000 (3 March 1981); doi: 10.1117/12.959620
Proc. SPIE 0257, High Resolution X-Ray Scattering Measurements For Advanced X-Ray Astrophysics Facility (AXAF), 0000 (3 March 1981); doi: 10.1117/12.959621
Proc. SPIE 0257, Characterization Of The Effects Of Scattering On Imaging X-Ray Optics Performance, 0000 (3 March 1981); doi: 10.1117/12.959622
Proc. SPIE 0257, Interpretation Of High-Resolution X-Ray Scattering Measurements, 0000 (3 March 1981); doi: 10.1117/12.959623
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