PROCEEDINGS VOLUME 0863
1987 SYMPOSIUM ON THE TECHNOLOGIES FOR OPTOELECTRONICS | 17-20 NOVEMBER 1987
Industrial Optoelectronic Measurement Systems Using Coherent Light
IN THIS VOLUME

0 Sessions, 31 Papers, 0 Presentations
All Papers  (31)
1987 SYMPOSIUM ON THE TECHNOLOGIES FOR OPTOELECTRONICS
17-20 November 1987
Cannes, France
All Papers
Proc. SPIE 0863, A Robot Based Automatic Paint Inspection System, 0000 (1 June 1988); doi: 10.1117/12.943477
Proc. SPIE 0863, The Design Of Coherent Light Measurement Systems For Operation Under Harsh Conditions, 0000 (1 June 1988); doi: 10.1117/12.943478
Proc. SPIE 0863, " High Bandwith Laser Heterodyne Interferometer To Measure Transient Mechanical Displacements ", 0000 (1 June 1988); doi: 10.1117/12.943479
Proc. SPIE 0863, Laser Metrology Systems Used For Reactor Inspection In The CEGB, 0000 (1 June 1988); doi: 10.1117/12.943480
Proc. SPIE 0863, Application Of Rotating Grating Systems In Laser Doppler Velocimetry, 0000 (1 June 1988); doi: 10.1117/12.943481
Proc. SPIE 0863, Velocity Field Visualization Using The Doppler-Picture Technique, 0000 (1 June 1988); doi: 10.1117/12.943482
Proc. SPIE 0863, Flexible Mirrors For Imaging Radiated Energy From Rotating Components, 0000 (1 June 1988); doi: 10.1117/12.943483
Proc. SPIE 0863, Automatic Measurement Of A Crater Volume By Means Of A Light Sheet Projection, 0000 (1 June 1988); doi: 10.1117/12.943484
Proc. SPIE 0863, Response Of Metallic Material To Micromachining, 0000 (1 June 1988); doi: 10.1117/12.943485
Proc. SPIE 0863, Astigmatic Turbine Blade Tip Clearance Sensor For Gas Turbine Aero Engines, 0000 (1 June 1988); doi: 10.1117/12.943486
Proc. SPIE 0863, White Light Holography Using Flexible Membrane Mirrors, 0000 (1 June 1988); doi: 10.1117/12.943487
Proc. SPIE 0863, Quantitative Evaluation Of Interference Patterns, 0000 (1 June 1988); doi: 10.1117/12.943488
Proc. SPIE 0863, Welding Robot Guidance By Look-Ahead Optical Sensors, 0000 (1 June 1988); doi: 10.1117/12.943490
Proc. SPIE 0863, CCD Application For Interferometric Fringe Analysis Of Eroded Surface, 0000 (1 June 1988); doi: 10.1117/12.943491
Proc. SPIE 0863, Surface Micro-Topography By Automatic Processing Of Projected Interference Fringes, 0000 (1 June 1988); doi: 10.1117/12.943492
Proc. SPIE 0863, Two Computer-Aided Methods For Data Reduction From Interferograms, 0000 (1 June 1988); doi: 10.1117/12.943493
Proc. SPIE 0863, A New Approach To 3-D Surface Texture Assessment On The Scanning Electron Microscope (Sem), 0000 (1 June 1988); doi: 10.1117/12.943494
Proc. SPIE 0863, Measurement Of Transient Flow Field Phenomena With A Digital Heterodyne Interferometer, 0000 (1 June 1988); doi: 10.1117/12.943495
Proc. SPIE 0863, Recent Application Of Electronic Speckle Pattern Interferometry At The Norwegian Institute Of Technology, 0000 (1 June 1988); doi: 10.1117/12.943496
Proc. SPIE 0863, 25 Years Of Holography The Development Of Holographic Testing, 0000 (1 June 1988); doi: 10.1117/12.943497
Proc. SPIE 0863, Photographic Speckle Pattern Interferometry: An Analysis Of Its Fourier Components And Their Application To Electronic Speckle Pattern Interferometry (ESPI)., 0000 (1 June 1988); doi: 10.1117/12.943498
Proc. SPIE 0863, Computer-Aided In-Plane-Displacement And-Strain Measurement By Means Of Holographic Interferometry, 0000 (1 June 1988); doi: 10.1117/12.943499
Proc. SPIE 0863, Strain Analysis Using TV Speckle Interferometer, 0000 (1 June 1988); doi: 10.1117/12.943500
Proc. SPIE 0863, The Investigation Of Deformations Of Natural Stones Under Test-Conditions By Electronic Speckle Pattern Interferometry (ESPI), 0000 (1 June 1988); doi: 10.1117/12.943501
Proc. SPIE 0863, Optoelectronic Measurement Systems In The Industrial Field At The Aerospatiale Aquitaine Plant, 0000 (1 June 1988); doi: 10.1117/12.943502
Proc. SPIE 0863, Holography And Torsional Problems, 0000 (1 June 1988); doi: 10.1117/12.943503
Proc. SPIE 0863, Modular Holography For Use In Industry, 0000 (1 June 1988); doi: 10.1117/12.943504
Proc. SPIE 0863, Curvature Radius Measurement Of Reflecting Surfaces By Moire Deflectometry, 0000 (1 June 1988); doi: 10.1117/12.943505
Proc. SPIE 0863, Development And Application Of A Fibre Optic Electronic Speckle Pattern Interferometer (ESPI), 0000 (1 June 1988); doi: 10.1117/12.943506
Proc. SPIE 0863, Pulsed Electronic Speckle Pattern Interferometry In Experimental Stress Analysis, 0000 (1 June 1988); doi: 10.1117/12.943507
Proc. SPIE 0863, Computer Automated Holometry For Automotive Applications, 0000 (1 June 1988); doi: 10.1117/12.943508
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