High-Magnetic Field Characterisation Of (Hg,Cd)Te Detectors

J Singleton; F Nasir; R J Nicholas

doi:10.1117/12.938545

22 November 1986 High-Magnetic Field Characterisation Of (Hg,Cd)Te Detectors

J Singleton, F Nasir, R J Nicholas

Proceedings Volume 0659, Materials Technologies for Infrared Detectors; (1986) https://doi.org/10.1117/12.938545
Event: 1986 International Symposium/Innsbruck, 1986, Innsbruck, Austria

Abstract

A description is given of the use of the Shubnikov-de Haas effect, parallel-field magnetoresistance and cyclotron resonance to give a rather complete characterisation of (Hg,Cd)Te photodetectors. The Shubnikov-de Haas and parallel-field magnetoresistance enable one to distinguish the separate contributions to conductivity from surface layers and bulk which bedevil normal characterisation methods such as the Hall effect. In addition, the surface carrier densities can be very accurately measured, and the number of populated surface subbands deduced. Cyclotron resonance is used to make an accurate determination of the x-value of the bulk material, and to measure the effective masses of the surface electrons, thus indicating whether the surface composition differs from that in the bulk. It is shown that these measurements are not only useful in the characterisation of detectors and material, but are of fundamental interest in the study of the two-dimensional electron gas: the surface electrons exhibit many novel modes of behaviour, such as enhanced or reduced polaronic effects and skipping orbits, the latter of which have only been previously observed in metals.

Citation Download Citation

J Singleton, F Nasir, and R J Nicholas "High-Magnetic Field Characterisation Of (Hg,Cd)Te Detectors", Proc. SPIE 0659, Materials Technologies for Infrared Detectors, (22 November 1986); https://doi.org/10.1117/12.938545

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