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20 August 2020 Tapping mode photonic force microscopy
Matthias Allkemper, Alexander Rohrbach
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Proceedings Volume 11463, Optical Trapping and Optical Micromanipulation XVII; 114630M (2020) https://doi.org/10.1117/12.2568057
Event: SPIE Nanoscience + Engineering, 2020, Online Only
Abstract
Photonic Force Microscopy (PFM) uses optically trapped nanoparticles to measure forces in the sub-piconewton range. This makes it a very soft probing technique that is perfectly suited to investigate surface interactions with biological samples. In addition, PFMs can be used in scan mode to create surface-profiles with a resolution better than the optical diffraction limit. A common problem for probing techniques that operate in contact mode is sticking of the probe to the sample. To overcome this problem, we present an intermittent contact mode PFM to improve the technique’s robustness by reducing contact times and binding between sample and probe.
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Matthias Allkemper and Alexander Rohrbach "Tapping mode photonic force microscopy", Proc. SPIE 11463, Optical Trapping and Optical Micromanipulation XVII, 114630M (20 August 2020); https://doi.org/10.1117/12.2568057
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KEYWORDS
Photonic microstructures
Microscopy
Atomic force microscopy
Profiling
3D scanning
Bacteria
Biomedical optics
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