Improved tapping mode photonic force microscopy

Matthias Allkemper; Alexander Rohrbach

doi:10.1117/12.2597644

1 August 2021 Improved tapping mode photonic force microscopy

Matthias Allkemper, Alexander Rohrbach

Proceedings Volume 11798, Optical Trapping and Optical Micromanipulation XVIII; 117980H (2021) https://doi.org/10.1117/12.2597644
Event: SPIE Nanoscience + Engineering, 2021, San Diego, California, United States

Abstract

Photonic Force Microscopy (PFM) uses optically trapped particles to measure fluctuation based forces and potential landscapes. This feature makes it a very soft probing technique that is well suited to investigate surface interactions with biological samples. In addition, PFMs can be used in scan mode to create surface-profiles with a resolution better than the optical diffraction limit. In this talk we present an improved intermittent contact (tapping) mode PFM and a revised data analysis for more detailed surface height profiles.

Conference Presentation

Citation Download Citation

Matthias Allkemper and Alexander Rohrbach "Improved tapping mode photonic force microscopy", Proc. SPIE 11798, Optical Trapping and Optical Micromanipulation XVIII, 117980H (1 August 2021); https://doi.org/10.1117/12.2597644

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