Numerical-analytical modeling of diffuse reflectance for material particles distributed on substrates

A. Shabaev; R. Furstenberg; C. Breshike; C. A. Kendziora; T. Huffman; R. A. McGill; S. G. Lambrakos

doi:10.1117/12.2618980

31 May 2022 Numerical-analytical modeling of diffuse reflectance for material particles distributed on substrates

A. Shabaev, R. Furstenberg, C. Breshike, C. A. Kendziora, T. Huffman, R. A. McGill, S. G. Lambrakos

Proceedings Volume 12094, Algorithms, Technologies, and Applications for Multispectral and Hyperspectral Imaging XXVIII; 120940X (2022) https://doi.org/10.1117/12.2618980
Event: SPIE Defense + Commercial Sensing, 2022, Orlando, Florida, United States

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Abstract

A numerical-analytical model and simulations are described concerning diffuse reflectance for surface-distributed material particles on substrates. The model combines an analytical formulation of Mie-scattering theory and a numerical procedure based on Kramers-Kronig analysis. The results of simulations using this model are compared with experimental measurements of diffuse reflectance for material particles distributed on a glass surface. The purpose of these comparisons is estimating the influence of background contributions to spectral features due to resonant scattering from finite-size particles. Evaluating the sensitivity of spectrum-feature extraction methodologies with respect to these background contributions is significant for practial detection of target materials.

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A. Shabaev, R. Furstenberg, C. Breshike, C. A. Kendziora, T. Huffman, R. A. McGill, and S. G. Lambrakos "Numerical-analytical modeling of diffuse reflectance for material particles distributed on substrates", Proc. SPIE 12094, Algorithms, Technologies, and Applications for Multispectral and Hyperspectral Imaging XXVIII, 120940X (31 May 2022); https://doi.org/10.1117/12.2618980

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