Ambient pressure offgassing apparatus for screening materials utilized in environments supporting optical spaceborne systems

Randall Heu; Joyce M. Steakley; Edward J. Petrosky

doi:10.1117/12.22611

1 November 1990 Ambient pressure offgassing apparatus for screening materials utilized in environments supporting optical spaceborne systems

Randall Heu, Joyce M. Steakley, Edward J. Petrosky

Author Affiliations +

Proceedings Volume 1329, Optical System Contamination: Effects, Measurement, Control II; (1990) https://doi.org/10.1117/12.22611
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

The method and setup developed to test optical support materials for the HST are presented in terms of general applications to the ambient offgassing of contamination-sensitive instruments. An ex situ vacuum UV spectrophotometer is employed to analyze optical witness samples for optical degradation related to offgassing contaminants that are condensed onto the samples. A table of the ambient offgassing-test results lists the weight loss, wavelengths, and presence of visible films on 15 materials. The offgassing initial requirement of less than 12 ppm and/or the requirement after testing of less than 0.1 ppm are not fulfilled in the cases of seven materials. The testing procedure is found to be an efficient method for screening nonmetallic materials that support spaceborne optical systems. The offgassing data can support standard outgassing data to screen candidate materials effectively.

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Randall Heu, Joyce M. Steakley, and Edward J. Petrosky "Ambient pressure offgassing apparatus for screening materials utilized in environments supporting optical spaceborne systems", Proc. SPIE 1329, Optical System Contamination: Effects, Measurement, Control II, (1 November 1990); https://doi.org/10.1117/12.22611

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