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A diffusion technique for the fabrication of waveguide structures in Bi12GeO20,Bi12SiO20 crystals is described. The infrared reflection spectroscopy for the different waveguides thickness has been used to clarify the diffusion mechanism. Reflection spectra of the crystals with different thicknesses of doped layer shows that doping ions formed a chemical bond with oxygen in the tetrahedral environment. In this case doping ions replace Ge, Bi, an Si ions in the crystals unit. Integrated optic waveguides with losses no higher than 1.5 - 2.0 dB/cm for near IR wavelength operation have been successfully formed.
Valeri A. Voznesensky andGeorge S. Svechnikov
"Surface-doped sillenite crystals for integrated optics", Proc. SPIE 2108, International Conference on Holography, Correlation Optics, and Recording Materials, (10 December 1993); https://doi.org/10.1117/12.165423
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Valeri A. Voznesensky, George S. Svechnikov, "Surface-doped sillenite crystals for integrated optics," Proc. SPIE 2108, International Conference on Holography, Correlation Optics, and Recording Materials, (10 December 1993); https://doi.org/10.1117/12.165423