Paper
14 November 1996 Residual stress measurement by laser annealing and speckle interferometry
James E. Millerd, James D. Trolinger, Chandra S. Vikram, Martin J. Pechersky
Author Affiliations +
Abstract
We present a design for a compact residual stress measurement sensor based on laser annealing and laser speckle interferometry. The instrument integrates laser diodes, holographic optical elements, a compact CO2 laser, and advanced data reduction techniques to provide quantitative measurements. In this paper we present a review of residual stress measurement using laser annealing, details of our design and preliminary measurement data.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James E. Millerd, James D. Trolinger, Chandra S. Vikram, and Martin J. Pechersky "Residual stress measurement by laser annealing and speckle interferometry", Proc. SPIE 2945, Nondestructive Evaluation of Aging Aircraft, Airports, and Aerospace Hardware, (14 November 1996); https://doi.org/10.1117/12.259080
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Holographic optical elements

Annealing

Semiconductor lasers

Laser interferometry

Prototyping

Sensors

Speckle interferometry

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