Paper
28 June 1999 In-situ identification of material property values for phase-change optical recording
Terril Hurst, Pramod K. Khulbe
Author Affiliations +
Abstract
As phase-change optical recording technology matures, partnerships emerge between companies to provide a complete optical data storage solution. A supplier of optical media and a optical disk drive supplier must exchange information, based on prototype evaluations, to establish media and drive specifications which optimize overall performance. For example, in the development of write strategies which result in acceptable jitter and media life, testing is important. But it can be very time-consuming to explore the effects of the many design parameters by iterating on media configurations in the laboratory. Therefore, simulation becomes an attractive option, if it (a) is verifiable using laboratory measurements, (b) requires a minimum number of media parameters, and (c) provides sufficient accuracy to enable good design decisions for both media and drive. For optimal jitter and media life, the simulation should point the way to a write strategy which precisely controls media temperature and cooling rate.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Terril Hurst and Pramod K. Khulbe "In-situ identification of material property values for phase-change optical recording", Proc. SPIE 3864, Joint International Symposium on Optical Memory and Optical Data Storage 1999, 38641Y (28 June 1999); https://doi.org/10.1117/12.997625
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Crystals

Reflectivity

Data modeling

Finite element methods

Optical recording

Computer simulations

Data centers

Back to Top