Paper
6 December 2001 Powerful microfocus x-ray and hard x-ray 1 MA x-pinch plasma source for imaging, spectroscopy, and polarimetry
Victor L. Kantsyrev, Bruno S. Bauer, Alla S. Shlyaptseva, Dmitri A. Fedin, Stephanie Hansen, Radu Presura, Stephan Fuelling, Steve Batie, Andrew Oxner, Harold Faretto, Nick D. Ouart, Sean Keely, Hank LeBeau, David Chamberlain
Author Affiliations +
Abstract
The x-ray emission of Ti, Fe, Mo, W and Pt x-pinches are currently bieng studied at the Nevada Terawatt Facility z- pinch machine (0.9-1.0 MA, 100 ns). New x-ray diagnostics for time-resolved spectroscopy and imaging has been developed and used in x-pinch experiments. The total x- ray/EUV yield was more than 10 kJ. The minimum x-ray pulse duration was 1.1 ns (Mo, W, Pt). For Ti, Mo and W pinches x-ray pulses occurred in two or three groups in the narrow time intervals after the start of the current. The most compact emitting region has been observed for a planar-loop Mo x-pinch (the number of hot spots ranging from 1-5 with a minimum size smaller than 30 micrometers at (lambda) <1.5-2 Angstoms). Strong jets were observed (Ti, Fe, Mo) directed toward the discharge axis, perpendicular to the wires. A structure of an x-pinch includes energetic electron beams directed toward the anode and along wires. The total beam energy increases from Ti to W. A pulse of hard x-ray radiation was observed moving upwards along the axial axis with an energy of several hundred keV(Mo). The size of this source was smaller than 1 mm. The measurements of temperature and density of x-pinch plasmas were based on theoretical modeling of K-shell Ti and L-shell Mo spectra (Te=1.5 keV for Ti, 0.8 keV for Mo, Ne up to 2- 3x1022 cm-3 with 1-10% of hot electrons).
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Victor L. Kantsyrev, Bruno S. Bauer, Alla S. Shlyaptseva, Dmitri A. Fedin, Stephanie Hansen, Radu Presura, Stephan Fuelling, Steve Batie, Andrew Oxner, Harold Faretto, Nick D. Ouart, Sean Keely, Hank LeBeau, and David Chamberlain "Powerful microfocus x-ray and hard x-ray 1 MA x-pinch plasma source for imaging, spectroscopy, and polarimetry", Proc. SPIE 4502, Advances in Laboratory-based X-Ray Sources and Optics II, (6 December 2001); https://doi.org/10.1117/12.449868
Lens.org Logo
CITATIONS
Cited by 4 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
X-rays

Molybdenum

Iron

Hard x-rays

X-ray imaging

Plasma

Imaging spectroscopy

RELATED CONTENT

High efficiency hard x ray spectrometer for sub ps laser...
Proceedings of SPIE (November 19 1998)
Characterization of the high Z 0.9 to 1.0 MA...
Proceedings of SPIE (January 07 2004)
The NeXT Mission
Proceedings of SPIE (July 15 2008)
The ASTRO-H Mission
Proceedings of SPIE (July 30 2010)

Back to Top