Improving low-temperature performance of infrared thin-film interference filters utilizing temperature dependence of refractive index of Pb1-xGexTe

Bin Li; Suying Zhang; Ping Xie; L. Zhang; Dingquan Liu; Fengshan Zhang

doi:10.1117/12.570365

10 January 2005 Improving low-temperature performance of infrared thin-film interference filters utilizing temperature dependence of refractive index of Pb_1-xGe_xTe

Bin Li, Suying Zhang, Ping Xie, L. Zhang, Dingquan Liu, Fengshan Zhang

Author Affiliations +

Proceedings Volume 5640, Infrared Components and Their Applications; (2005) https://doi.org/10.1117/12.570365
Event: Photonics Asia, 2004, Beijing, China

Abstract

Pb_1-xGe_xTe is a pseudobinary alloy of IV-VI narrow-gap semiconductor PbTe and GeTe, of which maximum refractive index corresponds to the ferroelectric phase transition. Since the temperature coefficient of refractive index can be tunable from negative to positive by changing the Ge composition, it is possible to utilize the intrinsic property in the fabrication of infrared thin-film interference filters. A simple Fabry-Perot type narrow-bandpass filter was fabricated, in which Pb_0.94Ge_0.06Te was substituted for PbTe. It was found that the low-temperature stability of the filter is obviously improved: in the temperature range of 80-300 K, the shift of center wavelength with temperature is reduced from 0.48 nm.K^-1 to 0.23 nm.K^-1; furthermore, the peak transmittance of filter fabricated with Pb_0.94Ge_0.06Te is ~3% over that fabricated with PbTe.

Citation Download Citation

Bin Li, Suying Zhang, Ping Xie, L. Zhang, Dingquan Liu, and Fengshan Zhang "Improving low-temperature performance of infrared thin-film interference filters utilizing temperature dependence of refractive index of Pb_1-xGe_xTe", Proc. SPIE 5640, Infrared Components and Their Applications, (10 January 2005); https://doi.org/10.1117/12.570365

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