Fluorescence monitoring of organic deposits

H. Schröder; S. Becker; Y. Lien; W. Riede; D. Wernham

doi:10.1117/12.752866

20 December 2007 Fluorescence monitoring of organic deposits

H. Schröder, S. Becker, Y. Lien, W. Riede, D. Wernham

Proceedings Volume 6720, Laser-Induced Damage in Optical Materials: 2007; 67200O (2007) https://doi.org/10.1117/12.752866
Event: Boulder Damage Symposium XXXIX: Annual Symposium on Optical Materials for High Power Lasers, 2007, Boulder, Colorado, United States

Abstract

In this paper, we present the continued joint effort of ESA/ESTEC and DLR laser laboratories of improving the fluorescence monitoring technique towards a quantitative means for analysis of UV laser-induced deposit formation on optical samples in vacuum. In addition, a separate low power UV fluorescence excitation light source was implemented into the system allowing the investigation of laser-induced deposition occurring during irradiation of optics with IR and VIS light beams.

Citation Download Citation

H. Schröder, S. Becker, Y. Lien, W. Riede, and D. Wernham "Fluorescence monitoring of organic deposits", Proc. SPIE 6720, Laser-Induced Damage in Optical Materials: 2007, 67200O (20 December 2007); https://doi.org/10.1117/12.752866

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