Deformation measurements using projected fringe profilometry

Wei-Hung Su; Wei-Ting Co

doi:10.1117/12.930602

15 October 2012 Deformation measurements using projected fringe profilometry

Wei-Hung Su, Wei-Ting Co

Proceedings Volume 8497, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications VI; 849713 (2012) https://doi.org/10.1117/12.930602
Event: SPIE Optical Engineering + Applications, 2012, San Diego, California, United States

Abstract

An approach using fringe projection to perform the deformation measurement is proposed. A fringe pattern is illuminated onto the dynamic object, and a CCD camera is employed to record the fringe distribution. For a sufficient long recording time, fringes on the obtained image are deformed by the topography of the object, and also, blurred by motion. Thus, the blurred fringes supply additional information to describe the deformation during the measurement. Only one shot measurement is required for data processing. This makes it possible to perform the deformation measurements with low environmental vulnerability.

Citation Download Citation

Wei-Hung Su and Wei-Ting Co "Deformation measurements using projected fringe profilometry", Proc. SPIE 8497, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications VI, 849713 (15 October 2012); https://doi.org/10.1117/12.930602

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